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Nikkei MICRODEVICES

January 2007

The Home is Next Target of the Device Market

Special Feature

Post-TV Display Application Focuses on Public Signs and Paper Replacements

Report LSI

Advantest Announced Test System for ECC in NAND Flash Memories

Report LSI

Production Line Temperature Controller Accurate to 0.01°C with 30% Reduction in Power Consumption

Inside FPD
Development of 55-Inch Full HD SED Panel

Inside MEMS

Acceleration Sensor Problem Solved by Hokuriku Electric Industry

Inside MEMS

Latest MEMS Technology Trend Observed in Semicon Japan

Report EDA

STARC Developed Standard Test Interface Language Usage Guide

Emerging Technology

Nonvolatile SRAM

Key Word

Image Safety

Keyperson

Denso Reveals In-Vehicle Device Strategy

Interview(ASML)

ASML's Lithography Strategy

Nikkei MICRODEVICES

January 2007

The Home is Next Target of the Device Market

Special Feature

Post-TV Display Application Focuses on Public Signs and Paper Replacements

Report LSI

Advantest Announced Test System for ECC in NAND Flash Memories

Report LSI

Production Line Temperature Controller Accurate to 0.01°C with 30% Reduction in Power Consumption

Inside FPD
Development of 55-Inch Full HD SED Panel

Inside MEMS

Acceleration Sensor Problem Solved by Hokuriku Electric Industry

Inside MEMS

Latest MEMS Technology Trend Observed in Semicon Japan

Report EDA

STARC Developed Standard Test Interface Language Usage Guide

Emerging Technology

Nonvolatile SRAM

Key Word

Image Safety

Keyperson

Denso Reveals In-Vehicle Device Strategy

Interview(ASML)

ASML's Lithography Strategy